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These patterns are for use with Paragon-neo to test O-RU devices intended for use in an LLS-C1 or LLS-C2 topology as per the requirements of the O-RAN CONF v8 document clause 3.3.3.
The patterns are built-in to the O-RAN Conformance Test App in the current release of Paragon-neo . The CAT masks for use with these impairments are built-into the current release of CATin to CAT standalone and integrated into Paragon-neo.
Noise Model Pattern
This pattern meets the network limit mask defined in Figure H.2.4-4 from O-RAN.WG4.CUS.0-v10.00 (class A O-DU mask), it has been generated using the time/phase error noise model method described in G.8273.2 Amd1 (02/2022) Appendix IX, it does not include the effect of a suppressed physical layer rearrangement as adding this transient would exceed the defined MTIE mask for the network limit. This pattern is built in to Paragon-neo from R11.
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These patterns use the sinusoidal tones specified in O-RAN CONF Table 3.3.3-1 to create the time/phase errors. They are built-in to Paragon-neo from R10.
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