WG4 CONF Patterns
These patterns are for use with Paragon-neo to test O-RU devices intended for use in an LLS-C1 or LLS-C2 topology as per the requirements of the O-RAN CONF v8 document clause 3.3.3.
The patterns are built-in to the O-RAN Conformance Test App in the current release of Paragon-neo . The CAT masks for use with these impairments are built-into the current release of CAT.
Noise Model Pattern
This pattern meets the network limit mask defined in Figure H.2.4-4 from O-RAN.WG4.CUS.0-v10.00 (class A O-DU mask), it has been generated using the time/phase error noise model method described in G.8273.2 Amd1 (02/2022) Appendix IX, it does not include the effect of a suppressed physical layer rearrangement as adding this transient would exceed the defined MTIE mask for the network limit.
Sinusoidal Model Patterns
These patterns use the sinusoidal tones specified in O-RAN CONF Table 3.3.3-1 to create the time/phase errors.
CUS Specification (Superseded by WG4 CONF)
Previous patterns provided for testing an LLS-C2 O-RU as per the O-RAN CUS document can be found below. These have been superseded by the CONF approach detailed above.