O-RAN O-RU test patterns

WG4 CONF Patterns

These patterns are for use with Paragon-neo to test O-RU devices intended for use in an LLS-C1 or LLS-C2 topology as per the requirements of the O-RAN CONF document clause 3.3.3.

The patterns are built-in to the O-RAN Conformance Test App. The CAT masks for use with these impairments are built-in to CAT standalone and integrated into Paragon-neo.

Noise Model Pattern

This pattern meets the network limit mask defined in Figure H.2.4-4 from O-RAN.WG4.CUS.0-v10.00 (class A O-DU mask), it has been generated using the time/phase error noise model method described in G.8273.2 Amd1 (02/2022) Appendix IX, it does not include the effect of a suppressed physical layer rearrangement as adding this transient would exceed the defined MTIE mask for the network limit. This pattern is built in to Paragon-neo from R11.

Sinusoidal Model Patterns

These patterns use the sinusoidal tones specified in O-RAN CONF Table 3.3.3-1 to create the time/phase errors. They are built-in to Paragon-neo from R10.

CUS Specification (Superseded by WG4 CONF)

Previous patterns provided for testing an LLS-C2 O-RU as per the O-RAN CUS document can be found below. These have been superseded by the CONF approach detailed above.