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O-RAN O-DU test patterns

O-RAN O-DU test patterns

As of Paragon-neo release R13, all PTP impairment patterns required for testing O-DU devices, as specified in O-RAN W4.TS.CONF v13 Clause 3.3.7, are integrated into the Paragon-neo on‑instrument O-RAN Conformance App:

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Further guidance on testing to the CONF specification is available in the Paragon-neo On‑Instrument Test Guide: CX3019 O-RAN O-DU Testing.

If you require impairment patterns defined in superseded versions of the CONF document (included in earlier Paragon-neo releases), or if you require the impairment patterns as standalone files, please submit a support request via the Calnex Support Portal.