These patterns are for use with Paragon-neo to test O-DU devices intended for use in an LLS-C1 or LLS-C2 topology (mandatory requirement) or LLS-C3 or LLS-C4 (optional) as per the requirements of the O-RAN CONF document clause 3.3.7.
These patterns are also built-in to Paragon-neo O-RAN Conformance Test App. The CAT masks for use with these impairments are built-in to CATv30 CAT standalone and integrated into Paragon-neo R10.
There are sinusoidal model patterns and a noise model pattern. For testing an O-DU at G.8271.1 Reference Point C, O-RAN CONF advises that the noise model pattern is more representative of real network conditions and transients, and therefore a more effective test of the O-DU under emulated network conditions.
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This pattern meets the network limit mask defined in ITU-T G.8271.1 Table 7-1/Figure 7-2, it has been generated using the time/phase error noise model method described in G.8273.2 Amd1 (02/2022) Appendix IX and includes the effect of a suppressed physical layer re-arrangement transient on the PTP time error. This pattern is built-in to Paragon-neo from R10.
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